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Universal stress-defect correlation at (100)semiconductor/oxide interfaces
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10.1063/1.3575559
/content/aip/journal/apl/98/14/10.1063/1.3575559
http://aip.metastore.ingenta.com/content/aip/journal/apl/98/14/10.1063/1.3575559
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/content/aip/journal/apl/98/14/10.1063/1.3575559
2011-04-04
2014-09-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Universal stress-defect correlation at (100)semiconductor/oxide interfaces
http://aip.metastore.ingenta.com/content/aip/journal/apl/98/14/10.1063/1.3575559
10.1063/1.3575559
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