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A schematic of (a) the front view (in plane) of the sample slab, (b) the stereogram of a unit cell, (c) a photo of our sample. The thickness of the dielectric layer is .
Calculated transmission/reflection spectra (a) along direction; (b) , (c) along direction of our twist sample slab, and (d) , of a monolayer of the sample with -oriented wires shown in Fig. 1(a).
The spectra of backward transmission for different slab thicknesses .
Snapshots of the electric field strength at different coordinates for -polarized [(a)–(e)] and -polarized [(f)–(j)] incident plane waves along the direction. (a) and (f): at of the incoming regime; (b) and (g): at of the front surface (entrance); (c) and (h) at within the dielectric layer; (d) and (i) at of the backside surface; (e) and (j): at of the outgoing regime. The electric field strength, as illustrated by the color bar, is normalized to that of the incident wave.
(a) Measured and (b) calculated forward transmission of our sample slab.
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