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A geometry for optimizing nanoscale magnetic resonance force microscopy
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View: Figures


Image of FIG. 1.
FIG. 1.

A nominally nonmagnetic Si cantilever (Ref. 13). Quality factor plotted as a function of magnetic field pointing perpendicular (i) and parallel (ii) to the lever’s angular rotation vector.

Image of FIG. 2.
FIG. 2.

(a) Experimental apparatus. Current flows in the microwire (red) along while the lever displacement is along . Inset (b) shows an SEM image of a Si cantilever with a polystyrene sample, and (c) shows a SEM of a microwire rf source with an integrated FeCo tip.

Image of FIG. 3.
FIG. 3.

spin signal in a polystyrene sample as a function of rf carrier frequency. Points are experimental data while solid lines are simulations. The insets depict the positions of the sample (colored circles) for each resonance curve relative to the FeCo tip (magnetized along the white arrow). The dashed lines mark the resonance frequencies of spins at .

Image of FIG. 4.
FIG. 4.

Cross section through the center of the FeCo tip with resonant slices in the xz-plane (surfaces of constant ). White arrow shows the magnetization direction of FeCo.

Image of FIG. 5.
FIG. 5.

Spin nutation at . Force signal is measured as a function of pulse length. A of 12 mT is extracted from a decaying sinusoidal fit of the Rabi oscillations shown in red.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: A geometry for optimizing nanoscale magnetic resonance force microscopy