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Field emission from single and few-layer graphene flakes
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10.1063/1.3579533
/content/aip/journal/apl/98/16/10.1063/1.3579533
http://aip.metastore.ingenta.com/content/aip/journal/apl/98/16/10.1063/1.3579533
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Optical image of a graphene flake at 50× magnification. (b) Typical Raman spectra measured for single- and bilayer graphene. (c) Schematic view of the experimental setup using a SMU interconnected to nanomanipulators in SEM chamber. (d) Photograph of the inner SEM chamber, and Inset: SEM image of graphene flake of Fig. 1(a) contacted by the nanomanipulators.

Image of FIG. 2.
FIG. 2.

(a) characteristics obtained after electrical stress with different values of maximum current. (b) FE characteristics measured at two different graphene-tip distances (100 nm, 600 nm). Inset shows the FN plot for . (c) Electrical breakdown resulting in melted tips and destroyed graphene as effect of high current.

Image of FIG. 3.
FIG. 3.

(a) I–V curves measured for increasing graphene-anode distance; (b) linear FN plot for FE characteristic (sweep 4). Inset: SEM image of single layer graphene.

Image of FIG. 4.
FIG. 4.

(a) FE current vs bias voltage for successive sweeps at graphene-anode distance. Arrows indicate the turn on level. (b) FE current vs time at a lower graphene-anode distance for 100 V applied voltage. Inset shows the FE current over a larger time scale.

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/content/aip/journal/apl/98/16/10.1063/1.3579533
2011-04-20
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Field emission from single and few-layer graphene flakes
http://aip.metastore.ingenta.com/content/aip/journal/apl/98/16/10.1063/1.3579533
10.1063/1.3579533
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