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(a) Optical image of a graphene flake at 50× magnification. (b) Typical Raman spectra measured for single- and bilayer graphene. (c) Schematic view of the experimental setup using a SMU interconnected to nanomanipulators in SEM chamber. (d) Photograph of the inner SEM chamber, and Inset: SEM image of graphene flake of Fig. 1(a) contacted by the nanomanipulators.
(a) characteristics obtained after electrical stress with different values of maximum current. (b) FE characteristics measured at two different graphene-tip distances (100 nm, 600 nm). Inset shows the FN plot for . (c) Electrical breakdown resulting in melted tips and destroyed graphene as effect of high current.
(a) I–V curves measured for increasing graphene-anode distance; (b) linear FN plot for FE characteristic (sweep 4). Inset: SEM image of single layer graphene.
(a) FE current vs bias voltage for successive sweeps at graphene-anode distance. Arrows indicate the turn on level. (b) FE current vs time at a lower graphene-anode distance for 100 V applied voltage. Inset shows the FE current over a larger time scale.
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