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Structured scintillator for hard x-ray grating interferometry
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10.1063/1.3583464
/content/aip/journal/apl/98/17/10.1063/1.3583464
http://aip.metastore.ingenta.com/content/aip/journal/apl/98/17/10.1063/1.3583464
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Grating interferometer with absorbing source grating , phase shifting grating and analyzer grating . The conventional absorbing analyzer grating and its separate, continuous scintillator (top half) are replaced by the structured scintillator grating, presented in this letter (bottom half).

Image of FIG. 2.
FIG. 2.

(a) Intensity of a pixel in a phase stepping scan over one grating period in 16 steps for both setups. (b) Scanning electron micrograph of the CsI filled analyzer grating.

Image of FIG. 3.
FIG. 3.

Differential phase contrast images of a square aluminum profile [(a)–(d)] and dark field images of zero (at the top), one, two, and three layers of paper [(e)–(h)]. The cross sections of both samples are sketched [(a) and (e)]. They are imaged using the absorption analyzer grating at 5500 counts [(b) and (f)], the absorption analyzer grating at 50 000 counts [(c) and (g)], and the structured scintillator at 5500 detector counts [(d) and (h)]. The exposure times are specified in seconds per phase step. Next to each image is a profile along the plotted vertical lines. The standard deviation (rms noise) is given within the marked rectangular regions of constant differential phase or scattering power respectively.

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/content/aip/journal/apl/98/17/10.1063/1.3583464
2011-04-27
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Structured scintillator for hard x-ray grating interferometry
http://aip.metastore.ingenta.com/content/aip/journal/apl/98/17/10.1063/1.3583464
10.1063/1.3583464
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