1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Electric field penetration in Schottky junctions probed by bias-dependent internal photoemission
Rent:
Rent this article for
USD
10.1063/1.3589375
/content/aip/journal/apl/98/19/10.1063/1.3589375
http://aip.metastore.ingenta.com/content/aip/journal/apl/98/19/10.1063/1.3589375
/content/aip/journal/apl/98/19/10.1063/1.3589375
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/apl/98/19/10.1063/1.3589375
2011-05-10
2014-09-30
Loading

Full text loading...

This is a required field
Please enter a valid email address
This feature is disabled while Scitation upgrades its access control system.
This feature is disabled while Scitation upgrades its access control system.
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electric field penetration in Au/Nb:SrTiO3 Schottky junctions probed by bias-dependent internal photoemission
http://aip.metastore.ingenta.com/content/aip/journal/apl/98/19/10.1063/1.3589375
10.1063/1.3589375
SEARCH_EXPAND_ITEM