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Room temperature concentration profiles calculated from 1 kHz C-V measurements for undoped ELOG structure before irradiation and after irradiation with thermal neutron fluence of and annealing at .
EBIC image of ELOG GaN sample before irradiation; accelerating voltage 10 kV, the full size of the figure .
EBIC image of ELOG GaN sample after irradiation with reactor neutrons and annealing to ; accelerating voltage 10 kV, the full size of the figure .
Admittance spectra C-T, for irradiated and annealed ELOG sample; C is capacitance, T-temperature, G is ac conductance, is the circular frequency, f is the measurement frequency (the data are shown for frequencies , 0.2, 0.3, 0.5, 1, 2, 3, 5, 10, 20, 30, 50, 100, 200, 300, 500, and 1000 kHz.
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