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(a) One-dimensional XRD pattern of grown on an LSAT substrate, where . The inset shows the (001) peak patterns of films with , 0.2, 0.4, and 0.5. Film (F) and substrate (S) peaks are identified. The higher angle split peaks from the films are indicated with * for and 0.2. (b) The (001) peak of the 2D diffraction pattern of a film with . (c) The out-of-plane -axis lattice parameters of 400 nm thick films as a function of Ga content.
Out-of-plane hysteresis loops at room temperature for films with , 0.2, 0.4, and 0.5. The lower right inset shows the coercivity and saturation moment at 10 kOe vs Ga content.
FR of thin films with , 0.2, 0.4, and 0.5 at 1550 nm wavelength as a function of applied magnetic field, measured with the magnetic field perpendicular to the film plane. The lower right inset shows the saturation FR at 10 kOe vs Ga content.
The optical transmission spectra of a 5 mm thick LSAT substrate and 400 nm thick thin films grown on LSAT. The inset shows the waveguide transmission loss for the TE and TM modes in a film with .
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