1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Correlation of the change in transfer characteristics with the interfacial trap densities of amorphous In–Ga–Zn–O thin film transistors under light illumination
Rent:
Rent this article for
USD
10.1063/1.3597299
/content/aip/journal/apl/98/23/10.1063/1.3597299
http://aip.metastore.ingenta.com/content/aip/journal/apl/98/23/10.1063/1.3597299
/content/aip/journal/apl/98/23/10.1063/1.3597299
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/apl/98/23/10.1063/1.3597299
2011-06-07
2014-09-19
Loading

Full text loading...

This is a required field
Please enter a valid email address
This feature is disabled while Scitation upgrades its access control system.
This feature is disabled while Scitation upgrades its access control system.
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Correlation of the change in transfer characteristics with the interfacial trap densities of amorphous In–Ga–Zn–O thin film transistors under light illumination
http://aip.metastore.ingenta.com/content/aip/journal/apl/98/23/10.1063/1.3597299
10.1063/1.3597299
SEARCH_EXPAND_ITEM