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Schematic view of the accumulation and transport of oxygen ions at the interface between electrode and oxide layer.
(a) Calculated concentration distribution as a function of depth from the interface with different interface barrier. (b) Calculated time evolution of concentration at different point.
Switching curves of ZnO device: (a) with TiN as cathode and (b) with Pt as cathode.
(a) Measured pulse voltage dependency of RESET time for TiN cathode device and the fitting curve based on the model. The inset shows the oscilloscope view of the pulse with minimal width in the measurement, indicating the RC delay effect can be ignored even though the pulse width is as narrow as . (b) Measured pulse voltage dependency of RESET time for TiN and Pt cathode devices.
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