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XRD patterns of the as-prepared and nanocrystalline magnets.
Cross-section backscattered electron images of (a) and (b) nanocrystalline magnets at for 500 h.
Dependences of thickness of IOL (a) and maximum energy product loss (b) for both and nanocrystalline magnets on oxidation time at .
AES depth profile (a) and photoelectron spectra in the IOL (b) of nanocrystalline magnet at for 20 h.
Room-temperature magnetic properties of and nanocrystalline magnets before and after oxidation test (, 500 h).
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