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(a) SEM image of a 150 nm Ni nanomagnet embedded within an array of 500 nm magnets. The dashed white line corresponds to the probe beam spot size. (b) Colormap of the simulated ground-state distribution of the average out-of-plane component of the magnetization at . Dynamic measurements taken on (c) a single 500 nm Ni magnet, (d) a single 150 nm Ni magnet, and (e) a 150 nm Ni magnet embedded within an array of 500 nm magnets (at ).
Bias field (out-of-plane) dependence of the peak frequencies of a 150 nm nanomagnet (circles) embedded within an array of 500 nm magnets (squares). The open symbols represent the measured data and the dashed lines are micromagnetic simulation of the average magnetization of the array (simulated bulk mode frequencies for 150 nm magnet omitted).
(a) SEM images of the sample with two 500 nm Ni magnets on either side of a 150 nm Ni nanomagnet for edge-to-edge spacings of 200–100 nm. (b) FFT spectra corresponding to the three magnet system with variable spacing at . The solid arrow points to the peak frequency of the edge mode of the 150 nm magnet, and the dashed arrow corresponds to the simulated value.
(a) Simulated magnetostatic field distribution (-component) for . (b) Total magnetostatic field values through the middle of the three element system at an applied field of for (solid line) and (dashed line).
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