Full text loading...
(a) XRD scans of films on a logarithmic scale. S designates the peak from the sapphire substrate. The inset illustrates the variation in the calculated values with different values. (b) The core level XPS spectra of films with different values.
(a)–(e) Magnified top-view TF-SEM micrographs of the films with , 0.016, 0.026, 0.046, and 0.097, respectively. (f) AFM micrograph with a scanning area of for the film with .
PL spectra of films at RT.
(a) M-H curves of films at RT. After subtracting a PM response for each curve, the hysteresis loops are displayed in (b).
Article metrics loading...