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Correlation between saturation magnetization and surface morphological features in thin films
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10.1063/1.3549696
/content/aip/journal/apl/98/5/10.1063/1.3549696
http://aip.metastore.ingenta.com/content/aip/journal/apl/98/5/10.1063/1.3549696
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) XRD scans of films on a logarithmic scale. S designates the peak from the sapphire substrate. The inset illustrates the variation in the calculated values with different values. (b) The core level XPS spectra of films with different values.

Image of FIG. 2.
FIG. 2.

(a)–(e) Magnified top-view TF-SEM micrographs of the films with , 0.016, 0.026, 0.046, and 0.097, respectively. (f) AFM micrograph with a scanning area of for the film with .

Image of FIG. 3.
FIG. 3.

PL spectra of films at RT.

Image of FIG. 4.
FIG. 4.

(a) M-H curves of films at RT. After subtracting a PM response for each curve, the hysteresis loops are displayed in (b).

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/content/aip/journal/apl/98/5/10.1063/1.3549696
2011-02-01
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Correlation between saturation magnetization and surface morphological features in Zn1−xCrxO thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/98/5/10.1063/1.3549696
10.1063/1.3549696
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