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Probing residual strain in epitaxial graphene layers on with Raman spectroscopy
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10.1063/1.3551625
/content/aip/journal/apl/98/5/10.1063/1.3551625
http://aip.metastore.ingenta.com/content/aip/journal/apl/98/5/10.1063/1.3551625
/content/aip/journal/apl/98/5/10.1063/1.3551625
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/content/aip/journal/apl/98/5/10.1063/1.3551625
2011-01-31
2014-10-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Probing residual strain in epitaxial graphene layers on 4H-SiC(0001¯) with Raman spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/98/5/10.1063/1.3551625
10.1063/1.3551625
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