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Highly collimated electron beams from double-gate field emitter arrays with large collimation gate apertures
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10.1063/1.3551541
/content/aip/journal/apl/98/6/10.1063/1.3551541
http://aip.metastore.ingenta.com/content/aip/journal/apl/98/6/10.1063/1.3551541
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

SEM micrographs of a double-gate FEA. (a) Top view and (c) cross-section. (b) Schematic diagram corresponding to the cross-section shown in (c). The shaded layers ( and ) are the thick insulators. and diameters are and , respectively. The inlay in (a) shows a transmission electron microscope (TEM) image of the emitter tip apex.

Image of FIG. 2.
FIG. 2.

Schematic diagram of the experimental setup. The extracted electron beam is amplified by a microchannel plate biased to 0.7 kV given by and detected by the phosphor screen biased at a voltage of 5 kV. The currents , , and were simultaneously recorded. denotes the emission angle of the electron beam at the emitter surface.

Image of FIG. 3.
FIG. 3.

Field-emission microscope images of electron beam at constant extraction bias of −80 V at collimation voltages of (a) , (b) −31, and (c) −61 V.

Image of FIG. 4.
FIG. 4.

Absolute value of emitter current (open squares), net current (filled squares), extraction gate current (filled circles), and the collimation gate current (open circles) at various ’s for fixed at −80 V.

Image of FIG. 5.
FIG. 5.

(a) Current density measured on the phosphor screen plotted against for fixed . The two inlaid pictures show the electron beam at of 0 V (bottom) and −69 V (top). (b) The relation between the emission angle and with the directions as defined in Fig. 3.

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/content/aip/journal/apl/98/6/10.1063/1.3551541
2011-02-09
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Highly collimated electron beams from double-gate field emitter arrays with large collimation gate apertures
http://aip.metastore.ingenta.com/content/aip/journal/apl/98/6/10.1063/1.3551541
10.1063/1.3551541
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