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Measurement of the valence band structure in dielectric films by a focused ion beam
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10.1063/1.3554433
/content/aip/journal/apl/98/6/10.1063/1.3554433
http://aip.metastore.ingenta.com/content/aip/journal/apl/98/6/10.1063/1.3554433
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Plots of the current signal and its derivative vs the collector potential .

Image of FIG. 2.
FIG. 2.

Schematic diagram illustrating the Auger neutralization of an ion on a dielectric surface.

Image of FIG. 3.
FIG. 3.

Plots of the Auger self-convolution normalized to 0.25 at its maximum value. The irregular curve represents the self-convolution constructed from the experimental data of in Fig. 2. The smooth curve is obtained from Eq. (9) for the characteristic energy spread least squares fitted to the experimentally constructed self-convolution.

Image of FIG. 4.
FIG. 4.

Plot of the state density function obtained numerically from Eqs. (5) and (6) for the experimentally constructed self-convolution in Fig. 3.

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/content/aip/journal/apl/98/6/10.1063/1.3554433
2011-02-09
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Measurement of the valence band structure in dielectric films by a focused ion beam
http://aip.metastore.ingenta.com/content/aip/journal/apl/98/6/10.1063/1.3554433
10.1063/1.3554433
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