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(a) PL spectra of films on Si(100) substrates at the wavelength pump of 654 nm. (b) integrated PL intensity of films on substrates and Si(100) substrates as a function of Yb concentration at 980 and 654 nm pump wavelengths.
XRD patterns of films on (a) Si(100) substrates and (b) substrates.
Decay time of films on substrates and Si substrates.
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