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AFM scans of bare Hastelloy substrate (a), with a rms roughness of 9.8 nm, and after a sequence of solution deposition coatings to planarize the surface (b), with a rms roughness of 0.56 nm. Note the difference in the height scales between (a) and (b).
TEM cross-sectional micrograph of a SDP coated substrate with an IBAD-MgO layer and a superconductor layer on top is shown in (a). STEM image of a substrate smoothing detail is shown in (b).
rms roughness, over a area, as a function of the number of SDP coatings for and solutions is shown in (a); (b) shows the rms roughness for the solution coatings, as in (a), followed by coatings with a solution.
MgO texture as a function of surface rms roughness, out-of-plane FWHM in (a) and in-plane FWHM in (b). Filled circle symbols represent the SDP solution data and squares represent the data. Small open circles represent data from mechanically polished samples.
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