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(a) Schematic of GaN/AlN/Si (001) template, (b) cross-sectional SEM image of a GaN/AlN/Si (001) template obtained by SAG and ELO, and (c) schematic of the multilayer structures of InGaN alloys grown on Si (111) and substrates.
XRD spectra detected from different templates used for Er doped InGaN growth: (a) GaN/AlN/Si (001), (b) , and (c) GaN/AlN/Si (111).
Room temperature infrared PL emission spectra near measured from grown on different templates: (a) , (b) , and (c) .
XRD spectra measured from grown on different templates: (a) , (b) , and (c) .
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