Full text loading...
(Color online) Typical RHEED intensity oscillations during deposition for LSVO films with different thickness. The AFM topography image of LSVO films with 8 uc thickness is shown in the inset.
(Color online) (a) XRD patterns (2θ-ω scans) for LSVO films with different thickness, (b) the variation of the c-axis lattice parameter with thickness, and (c) the reciprocal space mapping for LSVO film with 25 uc thickness.
(Color online) (a) Temperature-dependent electrical resistivity of LSVO films with different thickness. The arrows indicate a thickness dependent characteristic temperature (TMI) and (b) resistivity vs. T2 using the Fermi liquid model in the metallic region for films with 8–25 uc thickness.
(Color online) O1s edge XAS taken at normal incidence for different film thickness. Details of the V 3d t 2 g band for films with 5 and 8 uc thickness taken at normal (lower inset) and grazing (upper inset) incidence.
Article metrics loading...