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Response to “Comment on ‘Secondary electron yield of multiwalled carbon nanotubes’” [Appl. Phys. Lett. 99, 126103 (2011)]
2. J. Luo, J. H. Warner, C. Feng, Y. Yao, Z. Jin, H. Wang, C. Pan, S. Wang, L. Yang, Y. Li, J. Zhang, A. A. R. Watt, L.-M. Peng, J. Zhu, and G. A. D. Briggs, Appl. Phys. Lett. 96, 213113 (2010).
8. D. C. Joy, Monte Carlo Modeling for Electron Microscopy and Microanalysis. (Oxford University Press, New York, 1995).
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