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(Color online) (a) The XRD pattern of the CuGaO2 film on the c-plane sapphire substrate, and the inset shows the FWHM of the (006) diffraction peak, (b) AFM surface morphology, and (c) cross-sectional SEM image of the CuGaO2 film.
(Color online) (a) Raman spectra of the CuGaO2 film recorded at different temperatures from 85 to 873 K. Note that the label “*” indicates the substrate’s phonon modes. The temperature dependent of (b) frequency and (c) FWHM of the experimental data (dot lines) and the corresponding theoretical fitting (solid lines) for the A1 g phonon mode.
(Color online) (a) Transmittance spectra of the CuGaO2 film with different temperature, (b) the experimental (dotted curves) and fitting (solid curves) transmittance spectra at 8 and 300 K, (c) real (ɛ 1) and imaginary (ɛ 2) parts of the dielectric constants of the CuGaO2 film at 8 and 300 K, and (d) the temperature dependence of the OBG (dot curve) and Bose-Einstein model fitting result (solid curve).
The Tauc-Lorentz parameter values of the CuGaO2 film are determined from the simulation of transmittance spectra at 8, 150, 300K. Note that Aj , Epj , Γ j , and Eoj are the amplitude, peak position energy, broadening term, and Tauc gap energy of the oscillator, respectively.
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