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Heat recovery mechanism in the excitation of radiative polaritons by broadband infrared radiation in thin oxide films
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10.1063/1.3643464
/content/aip/journal/apl/99/13/10.1063/1.3643464
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/13/10.1063/1.3643464
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) Absorptance of the 0TH type of RP in a 250 nm thick aAl2O3 film on Al foil illuminated by TM polarized broadband IR radiation at various values of θ0.

Image of FIG. 2.
FIG. 2.

(Color online). Time evolution of the EMF generated upon illuminating system 1 at selected values of θ0. The vertical lines mark the EMFmax values. Inset: Schematics of systems 1 and 2.

Image of FIG. 3.
FIG. 3.

(Color online) (a) EMFmax versus θ0 for system 1 (filled triangles) and system 2 (filled circles). (b) Difference between EMFmax versus θ0 for systems 1 and 2. Experimental (c) and simulated (d) absorptance versus θ0 of the 0TH type of RP from IR spectra. The simulations were obtained from the Hansen (Ref. 9) and Kliewer (Ref. 4) methods.

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/content/aip/journal/apl/99/13/10.1063/1.3643464
2011-09-26
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Heat recovery mechanism in the excitation of radiative polaritons by broadband infrared radiation in thin oxide films
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/13/10.1063/1.3643464
10.1063/1.3643464
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