Full text loading...
(Color online) Measured angular remanence curves, for 11 nm and 16 nm thick films of CoCrPt-Ox., for fields applied at angles of 0° and 45° to the film normal. The material switches at lower applied fields as the angle is increased, characteristic of a reversal mechanism largely dominated by coherent reversal of grains.
(Color online) Angular dependence of the normalized remanent coercivity Hcr (θ)/Hcr (0) for CoCrPt-oxide thicknesses of (a) 11 nm and (b) 16 nm, as a function of applied field angle relative to the easy axis (film normal). Closed and open symbols are used for experimental and simulated data, respectively. The dashed black line shows the S-W model with 3° of granular easy axis dispersion, for comparison.
(Color online) Minimum values of (a) normalized remanent coercivity and (b) the associated minimum applied field angle, as a function of temperature for 11 nm (green triangles) and 16 nm (red dots) thick films of CoCrPt-Ox. Dashed lines are a guide to the eye. The minimum switching angle is independent of temperature (thermal activation) and depends only on film thickness (inter/intra granular coupling).
(Color online) Variation in the simulated angle dependent remanence loop of a 16 nm thick grain of CoCrPt as a function of exchange constant A. As the exchange coupling within the grain is reduced, the reversal mode of the grain becomes less coherent, resulting in a reduction in both the minimum switching field and the angle at which this occurs.
Article metrics loading...