Full text loading...
(Color online) (a) AFM topography image of a ∼10 nm-thick BFO film on a LAO substrate. (b) Synchrotron XRD RSM on (002) reflections of the 10 nm-thick BFO film. Two reflection spots arise from the substrate LAO (top) and BFO (bottom), respectively. The out-of-plane c lattice parameter is determined to be 4.64 Å, a typical value for the T-like phase of BFO.
(Color online) (a) and (b) Cross-sectional TEM images of the 12 nm BFO film. “T” and “R” denote the T-like and R-like phases, respectively. Inset of (b): FFT of the rectangle area in (b). (c)  zone axis SAED pattern taken from the BFO layer and the substrate LAO with the weak spots for BFO. The reflection splitting into three spots was enlarged in the inset, corresponding to the reflections of T-like, R-like BFO and LAO from the top to the bottom, respectively.
(Color online) Cross-sectional TEM images of BFO thin films on LAO with thickness of ∼24 nm (a), ∼30 nm (b), and ∼80 nm (c). Inset:  zone axis SAED pattern from the film containing R-like and T-like phases. It was indexed on the basis of the pseudo-cubic unit cell. The splitting of the spots indicates the coexistence of the T-like and R-like phases.
(Color online) Schematics of the as-grown biaxial clamping film (a), and cut to small pieces for TEM specimens preparation (b) and part of the quasi-uniaxial clamping TEM specimen after being ground, polished, and milled (c), the marked area was enlarged.
Article metrics loading...