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Evidence of lattice tilt and slip in m-plane InGaN/GaN heterostructure
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10.1063/1.3644978
/content/aip/journal/apl/99/13/10.1063/1.3644978
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/13/10.1063/1.3644978
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Figures

Image of FIG. 1.
FIG. 1.

(Color online) Reciprocal space maps for m-plane InGaN/GaN heterostructures recorded at 90° rotations to each other along both principal in-plane directions as indicated. The x-ray beam was aligned parallel to [0001] (a) on-axis , (b) off-axis and parallel to (c) on-axis , (d) off-axis .

Image of FIG. 2.
FIG. 2.

(Color online) Microarea analysis of lattice tilts for m-plane InGaN/GaN heterostructures by high-resolution microbeam x-ray diffraction. (a) on-axis micro-RSM in an arbitrary scanning spot. (b) Microbeam line-scan measurement of the reflection intensity of (a). (c) on-axis micro-RSM in one of the non-observed intensity areas in (b).

Image of FIG. 3.
FIG. 3.

Slip model schematics of the lattice tilts in a m-plane InGaN/GaN heterostructure. Slip planes and directions are as indicated.

Image of FIG. 4.
FIG. 4.

(Color online) TEM image taken from a (0001) cross-section at the InGaN/GaN heterointerface. (a) Dislocations nucleated on the prism plane. (b) Fourier-filtered transfer image of the relationship between strain relaxation and lattice tilt.

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/content/aip/journal/apl/99/13/10.1063/1.3644978
2011-09-29
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Evidence of lattice tilt and slip in m-plane InGaN/GaN heterostructure
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/13/10.1063/1.3644978
10.1063/1.3644978
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