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Wurtzite ZnO (001) films grown on cubic MgO (001) with bulk-like opto-electronic properties
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10.1063/1.3647846
/content/aip/journal/apl/99/14/10.1063/1.3647846
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/14/10.1063/1.3647846
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Figures

Image of FIG. 1.
FIG. 1.

(Color online) (a) RHEED pattern with incident electron beams along 〈110〉 azimuth after ZnO growth for 1 h at 300 °C. (b) The side view of the ZnO surface layers. Variant 1 and Variant 2 generate the two reciprocal lattices (a1*, b1*) and (a2*, b2*) in (a), respectively.

Image of FIG. 2.
FIG. 2.

(Color online) (a) Cross-sectional low magnification TEM image. (b) SAEDP from the ZnO film near the interface. In addition to the spots of the substrate MgO ([100] diffraction pattern), there are 5 sets of spots corresponding to five ZnO variants indexed as [2-10]V1, [−11-1]V3, [1-11]V4, [−21-1]V5, and [2-11]V6, respectively. (c) High resolution TEM image taken from the interface between MgO substrate and the ZnO film. The inset in the left is the SAEDP from this area. Both image and SAEDP indicate the presence of MgO, the V3 and the V4. The Moiré patterns in the image are due to the overlap of two variants. The left-bottom and right-bottom insets are the diffractograms of the areas labeled as V3 (solid blue circle) and V4 (dashed green circle), respectively. (d) HRTEM image taken from the ZnO film, showing that the growth plane of the ZnO film turns to (001) plane (V1 or V2 variant) from (011) plane (V3 variant).

Image of FIG. 3.
FIG. 3.

(Color online) (a) X-ray diffraction of the ZnO thin film (solid black lines) with the intensity fitted using Gaussian and Lorentz functions (dashed red lines). (b) CL spectra with an irradiation of 10 kV electron beam from the same ZnO film sample.

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/content/aip/journal/apl/99/14/10.1063/1.3647846
2011-10-07
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Wurtzite ZnO (001) films grown on cubic MgO (001) with bulk-like opto-electronic properties
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/14/10.1063/1.3647846
10.1063/1.3647846
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