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(a) TEM showing the detailed structure of a single nanocone of the black Si. (b) High resolution TEM of the nanocone structure and the inset showing a SAED pattern of the nanocone.
(Color online) (a) PL spectrum from black Si with excitation laser of 442 nm. (b) PL at 77 K and 300 K using excitation wavelength of 442 nm. The integration time is 300 s. (c) Visible and band-edge PL spectra using excitation wavelength 532 nm. (d) Comparison of PL spectra using excitation wavelength of 442, 488, and 532 nm.
(Color online) (a) Grating corrected CL spectrum of black Si using probe current of 25 nA. (b) Comparison of CL spectra with increasing the probe current. (c) SEI of the black Si (d) Panchromatic CL image of the same region shown by SEI.
(Color online) (a) Si 2p and 2s XPS spectra for Si, black Si and black Si with heavy oxide (b) High resolution Si 2p XPS spectra of Si, black Si with and without oxide layer (c) XPS valence band structure of Si and black Si showing variation in density of states (d) AES spectra of Si and black Si.
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