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Left: schematic representation of sample preparation. Right: AFM images different templates with increasing sphere size.
(Color online) Experimental (dots, left) and theoretical (lines, right) results for Kerr rotation (in black) and ellipticity (in red): from top to bottom: 780 nm, 457 nm, and 320 nm. The dashed lines (left) correspond to bulk Ni. Vertical bars (right) mark frequencies of the folded SPP modes for a Ni/Air system.
(Color online) Angle-resolved reflectance of 780 nm Ni structure for two different spot sizes: (a) 50 μm and (b) 10 μm.
(Color online) Experimental TMOKE spectra taken at θ = 45° for the 457 nm sample (a) and for the 780 nm sample (b), at two different in-plane angles, φ. In (a) a clear difference in the two measurements can be observed, reflecting the difference in the crystal orientation, whereas in (b) this difference is smeared out to a large extent, due to disorder effects.
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