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Synchrotron x-ray analyses of crystalline and electronic structures of carbon nanowalls
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10.1063/1.3659470
/content/aip/journal/apl/99/21/10.1063/1.3659470
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/21/10.1063/1.3659470
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Figures

Image of FIG. 1.
FIG. 1.

(a) Top and (b) cross-sectional scanning electron microscopy images, and (c) Raman spectrum of CNWs used in this study.

Image of FIG. 2.
FIG. 2.

(Color) (a) In-plane x-ray diffraction profile of CNWs with glancing angle of incident x-ray beam was 0.05°, and (b) C 1s photoelectron spectra of CNWs and HOPG (incident x-ray energy is 700 eV).

Image of FIG. 3.
FIG. 3.

(Color) X-ray absorption spectra of CNWs and HOPG. X-rays were incident at angles of 50° and 15° relative to the normal of the sample surface and HOPG, respectively. Black and blue lines indicate the polarization of incident x-rays perpendicular and parallel to the basal plane of HOPG.

Image of FIG. 4.
FIG. 4.

(Color) Soft x-ray emission spectra of CNWs.

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/content/aip/journal/apl/99/21/10.1063/1.3659470
2011-11-22
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Synchrotron x-ray analyses of crystalline and electronic structures of carbon nanowalls
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/21/10.1063/1.3659470
10.1063/1.3659470
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