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X-ray interference effects on the determination of structural data in ultrathin La2/3Sr1/3MnO3 epitaxial thin films
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10.1063/1.3663574
/content/aip/journal/apl/99/22/10.1063/1.3663574
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/22/10.1063/1.3663574
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) θ–2θ x-ray diffraction patterns of selected LSMO/STO samples. Points are experimental data. In (a)-(c), solid lines correspond to results of fits by adding the film and substrate contributions (dashed lines); In (d)-(f), solid lines are fits using the square of the sum of the electric fields amplitudes |ESL(ω)|2 = |ES(ω) + EL(ω)|2.

Image of FIG. 2.
FIG. 2.

(Color online) Out-of-plane lattice parameters for LSMO films, calculated either by means of (blue circles) Bragg’s law from the position of the diffraction peak of the layer or (red diamonds) by fitting the data using the square of the sum of the electric fields amplitudes |ESL(ω)|2 = |ES(ω) + EL(ω)|2. Dashed line indicates the bulk value of c-axis of LSMO.

Image of FIG. 3.
FIG. 3.

(Color online) (a) and (b) Amplitudes of the diffracted waves by the STO substrate (Eq. (2)) and a LSMO layer (Eq. (4)), respectively. (c) Total diffracted intensity calculated as (blue dashed) |E0 SL(ω)|2 = |ES(ω)|2 + |EL(ω)|2 and (red solid) |ESL(ω)|2 = |ES(ω) + EL(ω)|2.

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/content/aip/journal/apl/99/22/10.1063/1.3663574
2011-11-28
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: X-ray interference effects on the determination of structural data in ultrathin La2/3Sr1/3MnO3 epitaxial thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/22/10.1063/1.3663574
10.1063/1.3663574
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