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(a) Planar view TEM micrograph of MNCs distribution and cross-sectional view of (b) Au-NC and (c) Pt-NC samples. The average diameter of the NCs is around 3 nm.
(Color online) (a) Potential profile across the electron cloud (A-A′) and inset shows the KFM image after charge injection, (b) evolution of potential profile at t = 10 min and t = 83 min after charge injection in Pt- and Au- samples (normalized to peak at t = 10 min), (c) schematic potential landscape of the two adjacent nanocrystals during retention, and (d) illustration of two main charge decay mechanisms in NC-embedded gate stack: P1 corresponds to the inter-dot tunneling and P2 refers to vertical charge loss.
(Color online) Time dependence of normalized (a) potential and (b) FWHM of Au and Pt samples after charge injection of −4, −6, and −8 V for 10 s. The inset shows characteristic time constant τ from the curve fitting.
(Color online) Discharging (relaxation) current measurement in (a) Pt and (b) Au samples at temperature ranging from 300 to 450 K. The inset shows the change in magnitude of slope n with temperature from the curve fitting.
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