No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
On the “U-shaped” continuum of band edge states at the Si/SiO2 interface
6. J. T. Ryan, L. C. Yu, J. H. Han, J. J. Kopanski, K. P. Cheung, F. Zhang, C. Wang, J. P. Campbell, and J. S. Suehle, Appl. Phys. Lett. 98(23 ), 233502 (2011).
10. M. Masuduzzaman, A. Islam, R. Degraeve, M. Cho, M. Zahid, and M. Alam, Proceedings of the IEEE International Reliability Physics Symposium (Monterey, CA, 2011), p. 207.
11. J. T. Ryan, R. G. Southwick, J. P. Campbell, K. P. Cheung, C. D. Young, and J. S. Suehle, “Experimentally Based Methodology for Charge Pumping Bulk Defect Trapping Correction,” IEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA, 2011 (to be published).
12. F. Zhang, K. P. Cheung, J. P. Campbell, and J. S. Suehle, Proceedings of the IEEE International Reliability Physics Symposium (Anaheim, CA, 2010), p. 804.
Article metrics loading...
Full text loading...
Most read this month