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Lattice constants of the pentacene thin-film phase as function of the temperature obtained from three independent diffraction experiments (empty symbols). The literature values at room temperature are given additionally (filled symbols).
Diffraction patterns at different temperatures as function of the scattering vector component parallel to the substrate surface (qp ). The patterns were obtained by integrating Bragg peak series observed in a reciprocal space map along qz ranging from 0 to 1.0 Å−1. The observed peaks can be assigned to the thin-film phase (indicated above) and the Campbell phase (indicated below).
Sum of Bragg peak intensities for the thin-film (TF) and for the Campbell (CA) phase which have been extracted from the in-plane scattering patterns. The data for two independent samples are presented.
Specular diffraction around the 002 Bragg peak of the thin-film phase (qz ≈ 0.81 Å−1) and of the Campbell phase (qz ≈ 0.87 Å−1) at different temperatures. The symbols indicate the experimental data while the lines correspond to fits using the model defined in Eqs. (1) and (2).
(Color online) Sketch of the Gaussian height distribution of the pentacene crystallites at 360 K. The filled islands show the thin-film phase while the empty ones correspond to the Campbell phase. The mean island heights (N) are indicated by a horizontal colored and white line. The standard deviation (±σ) areas are shaded. The parameters have been obtained from the corresponding fit of the specular data shown in Fig. 4.
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