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Suppression of vacancy defects in epitaxial La-doped SrTiO3 films
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10.1063/1.3664398
/content/aip/journal/apl/99/23/10.1063/1.3664398
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/23/10.1063/1.3664398
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) (a) The mean positron lifetime as a function of positron implantation energy, the VTi and VSr lifetimes are shown as dashed lines. A schematic of the two thin films samples is also included. (b) The Makhovian positron implantation profiles and associated mean implantation (dashed lines) depths, the approximate thicknesses for the two films studies are marked (solid lines).

Image of FIG. 2.
FIG. 2.

(Color online) Positron lifetimes for the ∼400 nm, [La] ∼8 × 1017 cm−3, SrTiO3 film against positron implantation energy, (a) mean lifetimes, (b) deconvolved lifetime components (dashed lines denote 181 and 281 ps), and (c) associated component intensities. The individual lifetime components shown in (b) and (c) are denoted by squares, down triangles, open circles, and up triangles, order by decreasing lifetime value.

Image of FIG. 3.
FIG. 3.

(Color online) Positron lifetimes for the ∼300 nm, [La] ∼ 3 × 1019 cm−3, SrTiO3 film against positron implantation energy, (a) mean lifetime, (b) deconvolved lifetime components (dashed lines denote 181 and 281 ps), and (c) associated component intensities. The individual lifetime components shown in (b) and (c) are denoted by squares, down triangles, open circles, and up triangles, order by decreasing lifetime value.

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/content/aip/journal/apl/99/23/10.1063/1.3664398
2011-12-06
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Suppression of vacancy defects in epitaxial La-doped SrTiO3 films
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/23/10.1063/1.3664398
10.1063/1.3664398
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