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Rapid, substrate-independent thickness determination of large area graphene layers
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10.1063/1.3664633
/content/aip/journal/apl/99/23/10.1063/1.3664633
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/23/10.1063/1.3664633
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) (a) Optical image of graphene film on a SiO2/Si substrate measured under white light illumination. NB: The distance between markers is 0.4 mm, (b) a PSI image of the graphene sample depicted in (a), and (c) a 3D PSI image of a region of the graphene sample, as indicated by the square in (b).

Image of FIG. 2.
FIG. 2.

(Color online) (a) PSI image of a selected region of the graphene sample with lines indicating the trajectory of line scans 1 and 2, and (b) a plot of optical thickness versus position for scans 1 and 2.

Image of FIG. 3.
FIG. 3.

(Color online) (a) Plot of measured average optical thickness as a function of the number of graphene layers. Inset shows a PSI image of the graphene sample showing the position of line scans used for the thickness measurements, (b) PSI image of a selected region of the graphene sample with lines indicating the trajectory of line scans 1 and 2, and (c) calibrated line scan showing the graphene film thickness along line scans 1 and 2.

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/content/aip/journal/apl/99/23/10.1063/1.3664633
2011-12-09
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Rapid, substrate-independent thickness determination of large area graphene layers
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/23/10.1063/1.3664633
10.1063/1.3664633
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