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X-ray nanodiffraction of tilted domains in a poled epitaxial BiFeO3 thin film
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10.1063/1.3665627
/content/aip/journal/apl/99/23/10.1063/1.3665627
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/23/10.1063/1.3665627
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) Schematic of the BiFeO3 film, in-plane IDEs, and nanodiffraction experimental setup. Au IDEs were deposited to apply electric fields perpendicular and parallel to the as-grown VDWs. The ferroelectric hysteresis loops from cycling the two IDEs with 1 ms ± 150 V pulses are also shown. Focused beam specular nanodiffraction (shown schematically) was used to probe as-grown and poled regions of the film.

Image of FIG. 2.
FIG. 2.

(Color online) Schematic cross sections are shown (bottom row) of LT, RT, and UT stripe domains that are each illuminated by a nanofocused beam that fits fully inside the domain. The orientation of the illuminated lattice planes determines the local diffracted intensity distribution. The BiFeO3 (002) p Bragg peak region is coarsely divided into three regions of interest (LT, RT, UT) used to characterize the local domain tilt state.

Image of FIG. 3.
FIG. 3.

(Color online) SEM and corresponding x-ray nanodiffractions maps are shown of the IDE regions poled with E|| and E fields. The tilt magnitude maps were made with a ∼250 nm diameter defocused x-ray beam and are shown with a color scale given by . Areas 1-3 were further studied with a ∼40 nm beam.

Image of FIG. 4.
FIG. 4.

(Color online) Focused beam nanodiffraction tilt maps of the as-grown and poled BiFeO3 film are shown with contrast given by . The as-grown and poled E areas exhibit out-of-plane tilting indicative of vertical domain walls, while the E|| poled film switched to an untilted state consistent with a monodomain film or with slanted domain walls (dashed lines).

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/content/aip/journal/apl/99/23/10.1063/1.3665627
2011-12-06
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: X-ray nanodiffraction of tilted domains in a poled epitaxial BiFeO3 thin film
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/23/10.1063/1.3665627
10.1063/1.3665627
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