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Probing the electrostatics of self-assembled monolayers by means of beveled metal-oxide-semiconductor structures
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10.1063/1.3665630
/content/aip/journal/apl/99/23/10.1063/1.3665630
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/23/10.1063/1.3665630
/content/aip/journal/apl/99/23/10.1063/1.3665630
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/content/aip/journal/apl/99/23/10.1063/1.3665630
2011-12-09
2014-09-02
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Probing the electrostatics of self-assembled monolayers by means of beveled metal-oxide-semiconductor structures
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/23/10.1063/1.3665630
10.1063/1.3665630
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