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Anomalously high thermoelectric power factor in epitaxial ScN thin films
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10.1063/1.3665945
/content/aip/journal/apl/99/23/10.1063/1.3665945
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/23/10.1063/1.3665945
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Figures

Image of FIG. 1.
FIG. 1.

θ-2θ x-ray diffraction pattern from a ScN film deposited onto an Al2O3(0001) substrate. The inset shows a φ-scan plot of (solid line) the ScN 200 plane and (dot line) the Al2O3 plane.

Image of FIG. 2.
FIG. 2.

Cross-sectional TEM micrographs of a ScN film on Al2O3(0001) substrate in (a) overview and (b) high resolution of the film/substrate interface, and (c) high-resolution of a region in the bulk of the film.

Image of FIG. 3.
FIG. 3.

(Color online) Thermoelectric properties of a ScN film was measured from room temperature to 800 K, (a) Seebeck coefficient (left) and electrical resistivity (right) as functions of temperature, and (b) power factor S2/ρ vs. temperature from 300 to 800 K for three measured cycles.

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/content/aip/journal/apl/99/23/10.1063/1.3665945
2011-12-08
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Anomalously high thermoelectric power factor in epitaxial ScN thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/23/10.1063/1.3665945
10.1063/1.3665945
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