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Defects control for improved electrical properties in (Ba0.8Sr0.2)(Zr0.2Ti0.8)O3 films by Co acceptor doping
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10.1063/1.3666021
/content/aip/journal/apl/99/23/10.1063/1.3666021
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/23/10.1063/1.3666021
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Figures

Image of FIG. 1.
FIG. 1.

(Color online) (a) XRD θ-2θ patterns for all BSZT:Co films; (b) (202)-plane Phi scan of 0.6 at% BSZT:Co film fabricated on LSCO buffered STO; (c) Williamson-Hall plot for analysis of inhomogeneous strains in 0.6at% BSZT:Co film. The peaks are indexed as S for STO, B for BSZT, and L for LSCO, respectively.

Image of FIG. 2.
FIG. 2.

(Color online) ac electric-field dependence of dielectric permittivity for BSZT:Co films under subswitching fields of 1 MHz measured at room temperature.

Image of FIG. 3.
FIG. 3.

(Color online) (a) Leakage current properties of BSZT:Co films with undoped, 0.6 at. %, and 1.3 at. % Co, respectively; (b) P-F; (c) F-N plots of BSZT:Co films under a positive bias; (d) versus plots of BSZT:Co films under an negative bias.

Image of FIG. 4.
FIG. 4.

(Color online) dc electric-field dependence of dielectric permittivity and loss tangent for BSZT:Co films measured at 1 MHz. The solid lines indicate the fitting results by Johnson’s [Eq. (3)].

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/content/aip/journal/apl/99/23/10.1063/1.3666021
2011-12-08
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Defects control for improved electrical properties in (Ba0.8Sr0.2)(Zr0.2Ti0.8)O3 films by Co acceptor doping
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/23/10.1063/1.3666021
10.1063/1.3666021
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