1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
f
Measurement of exciton diffusion lengths in optically thin organic films
Rent:
Rent this article for
Access full text Article
/content/aip/journal/apl/99/24/10.1063/1.3668106
1.
1. Y. Sun, N. C. Giebink, H. Kanno, B. Ma, M. E. Thompson, and S. R. Forrest. Nature 440, 908 (2006).
http://dx.doi.org/10.1038/nature04645
2.
2. P. Peumans, A. Yakimov and S. R. Forrest, J. Appl. Phys. 93, 3693 (2003).
http://dx.doi.org/10.1063/1.1534621
3.
3. A. K. Ghosh and T. Feng. J. Appl. Phys. 49, 5982 (1978).
http://dx.doi.org/10.1063/1.324566
4.
4. B. A. Gregg, J. Sprague, and M. W. Peterson. J. Phys. Chem. B 101, 5362 (1997).
http://dx.doi.org/10.1021/jp9703263
5.
5. A. Haugeneder, M. Neges, C. Kallinger, W. Spirkl, U. Lemmer, J. Feldmann, U. Scherf, E. Harth, A. Gügel, and K. Müllen. Phys. Rev. B 59, 15346 (1999).
http://dx.doi.org/10.1103/PhysRevB.59.15346
6.
6. R. R. Lunt, N. C. Giebink, A. A. Belak, J. B. Benziger, and S. R. Forrest, J. Appl. Phys. 105, 053711 (2009).
http://dx.doi.org/10.1063/1.3079797
7.
7. B. E. Lassiter, G. Wei, S. Wang, J. D. Zimmerman, V. V. Diev, M. E. Thompson, and S. R. Forrest, Appl. Phys. Lett. 98, 243307 (2011).
http://dx.doi.org/10.1063/1.3598426
8.
8. G. Wei, R. R. Lunt, K. Sun, S. Wang, M. E. Thompson, and S. R. Forrest, Nano Lett. 10, 3555 (2010).
http://dx.doi.org/10.1021/nl1018194
9.
9. S. Y. Wang, L. Hall, V. V. Diev, G. D. Wei, X. Xiao, P. I. Djurovich, S. R. Forrest, and M. E. Thompson, Chem. Mater. 23, 4789 (2011).
http://dx.doi.org/10.1021/cm200104t
10.
10. O. S. Heavens, Optical Properties of Thin Solid Films (Dover, New York, 1965).
11.
11. L. A. A. Pettersson, L. S. Roman, and O. Inganäs, J. Appl. Phys. 86, 487 (1999).
http://dx.doi.org/10.1063/1.370757
12.
12. W. A. Luhman and R. J. Holmes, Adv. Funct. Mater. 21, 764 (2011).
http://dx.doi.org/10.1002/adfm.201001928
13.
13. H. Gommans, S. Schols, A. Kadashchuk, P. Heremans, and S. C. J. Meskers., J. Phys. Chem. C 113, 2974 (2009).
http://dx.doi.org/10.1021/jp809802q
14.
14. K. L. Mutolo, E. I. Mayo, B. P. Rand, S. R. Forrest, and M. E. Thompson, J. Am. Chem. Soc. 128, 8108 (2006).
http://dx.doi.org/10.1021/ja061655o
15.
15. X. Tong, B. E. Lassiter, and S. R. Forrest, Org. Electron. 11, 705 (2010).
http://dx.doi.org/10.1016/j.orgel.2009.12.024
16.
16. G. Wei, X. Xiao, S. Wang, J. D. Zimmerman, K. Sun, V. V. Diev, M. E. Thompson, and S. R. Forrest, Nano Lett. 11, 4261 (2011).
http://dx.doi.org/10.1021/nl2022515
17.
17. R. R. Lunt, J. B. Benziger, and S. R. Forrest. Adv. Mater. 22, 1233 (2010).
http://dx.doi.org/10.1002/adma.200902827
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/24/10.1063/1.3668106
Loading
/content/aip/journal/apl/99/24/10.1063/1.3668106
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/apl/99/24/10.1063/1.3668106
2011-12-13
2014-10-26

Abstract

Spectrally resolved photoluminescence quenching (SR-PLQ) is a convenient and accurate method for measuring the excitondiffusion length of organic materials; however, the requirement of optically thick films demanded by this technique poses practical limitations to its implementation. Through simulations of the optical field and exciton dynamics, we extend SR-PLQ to the case of optically thin organic films; i.e., films whose thickness is comparable to or less than that of the optical absorption length across the entire optical absorption spectrum. This allows for the characterization of films whose thickness is comparable to that used in practical organic optoelectronic devices. Using this method, we measure the diffusion lengths of several squaraine donors, the acceptor 3,4,9,10 perylenetetracarboxylic dianhydride, and the relationship between the donor, boron subphthalocyanine thickness and diffusion length.

Loading

Full text loading...

/deliver/fulltext/aip/journal/apl/99/24/1.3668106.html;jsessionid=54mdo43crjk4l.x-aip-live-06?itemId=/content/aip/journal/apl/99/24/10.1063/1.3668106&mimeType=html&fmt=ahah&containerItemId=content/aip/journal/apl
true
true
This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Measurement of exciton diffusion lengths in optically thin organic films
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/24/10.1063/1.3668106
10.1063/1.3668106
SEARCH_EXPAND_ITEM