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(Color) Shown is the comparison Raman spectra of bulk single crystal and bulk nanoscaled particle silicon. Inset shows a thick TiO2 layer scattering a laser pointer.
(Color) Comparison of a commercial SC with the as-delivered back contact and a diffuse TiO2 based rear reflector. Inset shows the relationship among incident light, SC, and diffusive film.
(Color) Shown are (a) the QEs of a silicon SC [with TiO2/diamond films (thickness as indicated)] on glass substrates placed in front (illuminated slide) (b) the performance of a germanium photovoltaic with the same layers in front. Inset illustrates the illumination and the trapping of near band edge light in the silicon SC cases.
(Color) The plot shows the calculated ratio of collected photon current to the incident photon flux as a function of the photon energy based on Eq. (5).
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