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Misfit strain dependence of ferroelectric and piezoelectric properties of clamped (001) epitaxial Pb(Zr0.52,Ti0.48)O3 thin films
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10.1063/1.3669527
/content/aip/journal/apl/99/25/10.1063/1.3669527
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/25/10.1063/1.3669527

Figures

Image of FIG. 1.
FIG. 1.

(Color) XRD patterns of SrRuO3/PZT/SrRuO3 thin films grown on the different substrates S1–S7 showing only PZT (00l) thin film orientation.

Image of FIG. 2.
FIG. 2.

(Color) (a) P-E loops of the PZT samples S1, S5, and S7, performed at 200 kV/cm amplitude and 1 kHz frequency and (b) d33-E loops of the same PZT samples, measured at AC-voltage of 200 mV and 1 kHz frequency. The base signal is 200 kV/cm at 0.2 Hz and the output signal is averaged over 100 cycles.

Image of FIG. 3.
FIG. 3.

(Color) (a) Calculated stability range of the r-phase in epitaxial PZT films as a function of Zr content (solid lines) and the obtained misfit strain values (open squares). (b) Calculated misfit strain dependence (solid lines) on P 3 (black), ɛ 33 (blue) and d 33 (red), and measured data points (open squares). The inset shows the calculated Qeff (solid line) and obtained values (squares).

Tables

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Table I.

Measured and calculated properties of the PZT samples on different substrates S1–S7 at room temperature ordered in decreasing misfit strain.

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/content/aip/journal/apl/99/25/10.1063/1.3669527
2011-12-22
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Misfit strain dependence of ferroelectric and piezoelectric properties of clamped (001) epitaxial Pb(Zr0.52,Ti0.48)O3 thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/25/10.1063/1.3669527
10.1063/1.3669527
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