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(Color) XRD patterns of SrRuO3/PZT/SrRuO3 thin films grown on the different substrates S1–S7 showing only PZT (00l) thin film orientation.
(Color) (a) P-E loops of the PZT samples S1, S5, and S7, performed at 200 kV/cm amplitude and 1 kHz frequency and (b) d33-E loops of the same PZT samples, measured at AC-voltage of 200 mV and 1 kHz frequency. The base signal is 200 kV/cm at 0.2 Hz and the output signal is averaged over 100 cycles.
(Color) (a) Calculated stability range of the r-phase in epitaxial PZT films as a function of Zr content (solid lines) and the obtained misfit strain values (open squares). (b) Calculated misfit strain dependence (solid lines) on P 3 (black), ɛ 33 (blue) and d 33 (red), and measured data points (open squares). The inset shows the calculated Qeff (solid line) and obtained values (squares).
Measured and calculated properties of the PZT samples on different substrates S1–S7 at room temperature ordered in decreasing misfit strain.
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