Full text loading...
X-ray diffraction patterns of Mn3Ni1 − xCuxN samples in the 2θ range of 20° to 90°: (l) Mn3NiN, (2) Mn3Ni0.7Cu0.3N, (3) Mn3Ni0.5Cu0.5N, (4) Mn3Ni0.3Cu0.7N, and (5) Mn3CuN.
(Color online) Temperature (in unit of K) dependence of the electrical resistivities measured during a warming process from 10 K to 360 K in Mn3Ni1−xCuxN materials: (a) Mn3NiN, (b) Mn3Ni0.7Cu0.3N (during the cooling and warming processes), (c) Mn3Ni0.5Cu0.5N, (d) Mn3Ni0.3Cu0.7N, and (e) Mn3CuN.
(Color online) The temperature-dependent magnetization M (T) of Mn3Ni1−xCuxN measured during a warming process in an applied magnetic field μ 0 H = 0.5 T. Note: (b) shows the magnified M-T curves of (a).
(a) Temperature dependence of the resistivity and the magnetization for the compound Mn3Ni0.7Cu0.3N. In addition, the relationship (ΔT = 5 K) between the TM and TNZ for Mn3Ni0.7Cu0.3 N is also shown. (b) Relationship between the temperature of magnetic transition (triangles) and the temperature of NZ-TCR (circles) in the Mn3Ni1 − xCuxN compounds (x = 0, 0.3, 0.5, 0.7, and 1.0).
The fitting parameters dρ/dT and the calculated results of TCR value for Mn3Ni1−xCuxN samples.
Article metrics loading...