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Distribution of electronic reconstruction at the n-type LaAlO3/SrTiO3 interface revealed by hard x-ray photoemission spectroscopy
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10.1063/1.3672099
/content/aip/journal/apl/99/26/10.1063/1.3672099
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/26/10.1063/1.3672099
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Figures

Image of FIG. 1.
FIG. 1.

(Color online) (a) Schematic illustration of the HAXPES measurement under θ < θc . (b) 3 × 3 μm2 AFM image of a 5-uc LaAlO3 film grown on a TiO2-terminated SrTiO3 substrate. (c) Temperature dependence of sheet resistance R per square unit measured from LAO/STO.

Image of FIG. 2.
FIG. 2.

(Color online) (a) Al 2s core-level spectra of LAO/STO measured with various grazing angles θ. (b) Intensities of La 4d and Al 2s core-level photoelectrons as a function of θ. Blue and red lines are for eye guide.

Image of FIG. 3.
FIG. 3.

(Color online) (a) Ti 2p HAXPES spectra with selected grazing angles measured from samples of LAO/STO, bare SrTiO3, and SrTiO3 doped with 5% Nb by weight. (b) Measured and simulated Ti3+/Ti4+ of Ti 2p HAXPES of LAO/STO as a function of grazing angle. The inset shows the variation of chi-square value of fitting as λe changes.

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/content/aip/journal/apl/99/26/10.1063/1.3672099
2011-12-27
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Distribution of electronic reconstruction at the n-type LaAlO3/SrTiO3 interface revealed by hard x-ray photoemission spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/26/10.1063/1.3672099
10.1063/1.3672099
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