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(Color online) (a) Setup for the T-El detection. The SPP mode is locally launched in the K-R configuration. The reflected power is measured using a photodiode (PD). (b) Optical image of a typical sample used in this study (scale bar = 50 μm). The yellow ellipse depicts where the incident light is focused.
(Color online) (a) Normalized T-El voltage as a function of the λ/2 waveplate orientation (α = 90° corresponds to TM polarization) compared to Malus’s law (sin2(2α)). (b) Comparison of the experimental T-El voltage (square) and the computed SPP power (diamonds) as a function of the angle of incidence for an incident focused spot. Insets: experimental and computed reflected spots projected onto a screen for Δθ = 2° revealing the dark lines characteristic of the SPP excitation by a focused spot.
(Color online) (a) VNi − Ni voltage as a function of the reflected power in the case of a reference waveguide and a narrowed waveguide (below cut-off). (b) (resp. (c)) Optical image of the reference (resp. narrowed) waveguide (scale bar = 50 μm). The arrows show scattering spots on the TC junction (b) and the entry of the narrowed waveguide (c).
(Color online) (a) Optical image of the sample used to measure the heat transfer coefficient of the system (scale bar = 100 μm). (b) Experimental (dots) and computed (solid line) temperature distribution along the strip for a TE polarized incident spot.
(Color online) (a) VNi − Ni voltage as a function of the coupled SPP power at different distances from the launching pad of 25 μm (triangles), 50 μm (dots), 75 μm (squares). Computed voltage (diamonds) for a distance of 50 μm. (b) Comparison of the computed (solid line) and experimental (dots) differential temperature as a function of the distance x to the launching pad.
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