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High frequency capacitance-voltage technique for the extraction of interface trap density of the heterojunction capacitor: Terman’s method revised
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10.1063/1.3615279
/content/aip/journal/apl/99/5/10.1063/1.3615279
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/5/10.1063/1.3615279
/content/aip/journal/apl/99/5/10.1063/1.3615279
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/content/aip/journal/apl/99/5/10.1063/1.3615279
2011-08-01
2014-11-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: High frequency capacitance-voltage technique for the extraction of interface trap density of the heterojunction capacitor: Terman’s method revised
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/5/10.1063/1.3615279
10.1063/1.3615279
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