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Effects of ferroelectric dead layer on the electron transport in ferroelectric tunneling junctions
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10.1063/1.3619841
/content/aip/journal/apl/99/5/10.1063/1.3619841
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/5/10.1063/1.3619841
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) Sketch of the MFM junction with two ferroelectric dead layers, σ s and σ s stand for the screening charges in the left and right electrodes, respectively.

Image of FIG. 2.
FIG. 2.

(Color online) TER ratio, , as a function of FE barrier thickness for different directions of the interface dipoles, the sign “+”(“−”) stands for the interface dipoles pointing to the right (left) direction. The inset shows the corresponding local potential energy profile for d f  = 2 nm. The arrows in the insert denote the direction of P f .

Image of FIG. 3.
FIG. 3.

(Color online) TER ratio varies with the left interface polarization P iL . P iR is fixed as |P iR | = 0.13 C/m2, and the barrier thickness is selected as d f  = 2 nm. The sign “+” and “−” denote the direction of interface dipoles dot line is added for comparison, which is the TER of the FTJ without dead layers.

Image of FIG. 4.
FIG. 4.

(Color online) TER as a function of (a) the dielectric constant of the left interface and (b) the dielectric constant of the right interface, and screening charge density as a function of (c) the dielectric constant of the left interface and (d) the dielectric constant of the right interface. Dash lines denote P iL  = −P iR  = 0.13 C/m2, which is smaller than the magnitude of P f , and solid lines stand for P iL  = −P iR  = 0.4 C/m2, which is larger than the magnitude of P f . Dot line indicates the TER without consideration of dead layers. The insets in (c) and (d) represent the derivatives of σ s with ε iL and ε iR for P f pointing to the right.

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/content/aip/journal/apl/99/5/10.1063/1.3619841
2011-08-01
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Effects of ferroelectric dead layer on the electron transport in ferroelectric tunneling junctions
http://aip.metastore.ingenta.com/content/aip/journal/apl/99/5/10.1063/1.3619841
10.1063/1.3619841
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