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(Color online) Reciprocal space map around (a) (002) and (b) (103) reflections of a [PT10/PZT11]20 SL grown on STO. The presence of a/c domain patterns is clearly detected. The brackets highlight the modulation of a- and c-domains.
TEM cross-section micrograph of a [PT22/PZT22]10 superlattice. The image shows the 90° domain walls (black arrows), characteristic of a/c domain structure. Domains propagate throughout the entire film thickness.
(Color online) RSMs around the (a) (002) and (b) (103) Bragg peaks of a [STO2/PT8/STO2/PZT10]20 SL grown on STO substrate. The brackets highlight the modulation along [00L] direction. The position of the dashed line is characteristic of the in-plane lattice parameter of the SL, which is different from that of the substrate.
High magnification along the 010 zone axis (a) and bright field TEM images (b) of a [PT8/STO2/PZT10/STO2]20 SL cross-section. The bright layers in (a) correspond to STO layers. The absence of a-domain is confirmed.
Structural parameters in PT and PZT 20-80 layers in several SLs. nPT, nSTO, and nPZT represent the thickness in unit cells of PT, STO, and PZT 20-80, respectively.
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