Full text loading...
Ag nanoparticle formation by different annealing time durations for (a) 15 min and (b) 30 min. Cross-sectional images after RIE process for (c) 15 min and (d) 30 min annealed samples. Higher density SiNPs (SiNP-H) were formed from the 15 min annealed sample compared to the 30 min annealed sample (SiNP-L). AZO film was deposited on (e) SiNP-H and (f) SiNP-L.
(Color online) (a) A TEM image shows periodic SiNPs. (b) A magnified TEM image from the region marked with the solid line. (c) A HRTEM image shows the interface between a SiNP and the AZO coating layer. (d) EDS profiles obtained from the solid line in (a). (e) Depth profiles for an AZO-coated planar substrate. (f) AZO-coated SiNPs.
(Color online) The reflectance profiles from planar Si, AZO-coated planar Si, SiNPs and AZO-coated SiNPs. A clear reduction of reflection was observed with insertion of an AZO film in the air-Si system. A significant reduction of reflection was observed from the nanopillar textured substrate.
(Color online) (a) Schematic diagram of the AZO-coated SiNPs. (b) Dark IV characteristics. (c) Light illuminated IV responses. A thin AZO coating on a SiNP forms a radial n/p heterojunction. A significant current enhancement was observed from the SiNP textured substrate due to enlargement of the surface area.
Article metrics loading...